Coaxpress Frame Grabbers
Camera Link Frame Grabbers
Non-Standard AnalogFrame Grabbers
Standard PAL/NTSC/1080Pvideo capture cards
Image AnalysisSoftware Tools
Evaluation andprototyping applications
Image acquisition software
GigE Vision, USB3 Vision, CoaXPress
IMX Pregius, MIPI CSI‑2
Machine Vision Development Kit
Sub-pixel measurement & dimension control library
Open eVision Studio is the evaluation, prototyping and development tool of Open eVision. Its intuitive graphical user interface allows you to call and immediately see the result of any of eVision's 2D image processing functions. A scripting functionality generates the corresponding code, which can then be copied and pasted into your application. Open eVision Studio is free (when using Open eVision 2.0 and above) and does not require any license. Just click on DOWNLOAD OPEN EVISION STUDIO and install Open eVision. Sample images, manuals and sample programs are included.
EasyGauge features advanced built-in calibration capabilities to transparently convert pixel measurements to physical units; this relieves the user of the need to convert coordinates. Non-square pixels and rotated coordinate axis are supported. EasyGauge also provides means to determine and correct perspective and optical distortion, with no performance loss.
EasyGauge is a cutting-edge measurement and dimension control library for use in gauging and metrology applications. By relying on proven sub-pixel edge detection (Point & Line) and shape fitting (Rectangle, Circle, Wedge & Polygon) algorithms, it allows determining the dimension, position, curvature, size, angle or diameter of manufactured parts with an excellent accuracy. Robustness is ensured by powerful edge-point selection mechanisms that are intuitive and easy to tune, allowing measurement in cluttered images. In addition, EasyGauge also supports the automatic measurement of parallel sides, thus providing means of measuring the thickness of flat or bent objects, as well as the precise location of corners.
EasyGauge supports grouping of the measurement gauges and lets these groups track the measured items in the image. These can freely translate and/or rotate while the probes are repositioned accordingly. Derived measurements such as distances between feature points can then be computed.
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