检测非均匀表面上的细微缺陷
EasySpotDetector 利用局部分割技术从背景中提取突出的对象。它适用于多种材料,例如薄膜、涂层表面、钢材、电池箔、玻璃……通过特定的参数可以选择缺陷的方面和大小,也可以选择检测灵敏度。这种分割技术面对杂色也表现出色,而且不需要进行上下文训练或校准。
适合于电池、纸张、薄膜或玻璃行业的先进表面检测
© EURESYS S.A. - Subject to change without notice
2/3/2025 Datasheet 适合于电池、纸张、薄膜或玻璃行业的先进表面检测 ![]()
Main benefitsOther benefits规格Software
Image processing
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EasySpotDetector 利用局部分割技术从背景中提取突出的对象。它适用于多种材料,例如薄膜、涂层表面、钢材、电池箔、玻璃……通过特定的参数可以选择缺陷的方面和大小,也可以选择检测灵敏度。这种分割技术面对杂色也表现出色,而且不需要进行上下文训练或校准。
Supported operating systems:
Microsoft Windows 11, 10, 8.1, 7 for x86-64 (64-bit) processor architecture
Linux for x86-64 (64-bit) and ARMv8-A (64-bit) processor architectures with a glibc version greater or equal to 2.18
Minimum requirements:
8 GB RAM
Optional NVidia GPU
Supported programming languages :
The Open eVision libraries and tools support C++, Python and the programming languages compatible with the .NET Framework (C#, VB.NET)
C++ requirements: A compiler compatible with the C++ 11 standard is required to use Open eVision
Python requirements: Python 3.11 or later is required to use the Python bindings for Open eVision
.NET requirements: .NET Framework versions 4.8 or later are supported
Supported Integrated Development Environments:
Microsoft Visual Studio 2017 (C++, C#, VB .NET, C++/CLI)
Microsoft Visual Studio 2019 (C++, C#, VB .NET, C++/CLI)
Microsoft Visual Studio 2022 (C++, C#, VB .NET, C++/CLI)
QtCreator 4.15 with Qt 5.12
Image source:
Any 8-bit grey scale image, no size limit
Region of interest:
Explicit or automatic selection of the region of interest (an oriented rectangle is fitted to the part’s edges)
A list of detected spots with their type (particle or scratch), position and size, strength, and pixel level segmentation map
Optionally, if a deep learning classifier is loaded, a class and a probability is set for each spot. The deep learning classifier is a trained EasyClassify tool.
Display functions are provided to draw the spot bounding boxes and segmented pixel
Processing speed on single core Intel i7-10850H:
Particle detection only: 200 MPixels/s
Particle and scratch: 60 MPixels/s
Minimum defect size:
2x2 pixels
No maximum defect size
PC4190 Open EasySpotDetector for USB dongle
PC4340 Open eVision EasySpotDetector
PC6512 eVision/Open eVision USB Dongle (empty)
PC6513 eVision/Open eVision Parallel Dongle (empty)
PC6514 Neo USB Dongle (empty)